Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1526656 | Materials Chemistry and Physics | 2008 | 5 Pages |
Abstract
Commercially pure titanium sputtering target scraps of purity 4N5 (99.995Â at.%) were melted into circular solid ingots using electron beam melting (EBM). Variation of electrical resistivity and Vickers hardness were studied in oxygen and yttrium doped titanium buttons ranged from 500 to 7900Â ppm and 0.556 to 3.226Â wt.%, respectively. X-ray diffraction patterns conformed to the hcp structure in all the oxygen and yttrium doped titanium samples. Increase in O content (500-7900Â ppm) in Ti has increased the electrical resistivity, where as increase in Y (0.556-3.226%) content in Ti has decreased it. The electrical resistivity and Vickers hardness with the variation of oxygen or yttrium doping content in the titanium were found to have a similar trend.
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Authors
Kyung-Ho Heo, N.R. Munirathnam, Jae-Won Lim, Minh-Tung Le, Good-Sun Choi,