| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1527127 | Materials Chemistry and Physics | 2008 | 4 Pages |
Abstract
PMN-PT 68/32 thin films have been prepared on Pt/Si, ITO coated glass, stainless steel and silicon substrates in the identical processing conditions by sol–gel process. Annealing temperature of 600 °C was ascertained by thermo gravimetric analysis (TGA) study of the dried sol–gel powder of PMNT-PT 68/32 composition. X-ray diffraction (XRD) study showed ∼95% perovskite phase formation on Pt/Si and ITO coated glass substrates. SEM micrographs showed the formation of sub micron size grains on Pt/Si and ITO coated glass substrates. Diffuse phase transition with transition temperature (Tc) ∼190 °C was observed in 0.8 μm thick PMN-PT 68/32 films deposited on Pt/Si and ITO coated glass substrates.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
P. Kumar, Sonia, R.K. Patel, C. Prakash, T.C. Goel,