| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1527653 | Materials Chemistry and Physics | 2007 | 6 Pages |
Abstract
CuIn3Te5 films were grown by stepwise flash evaporation from powder CuIn3Te5 source. X-ray diffraction and particle induced X-ray emission analyses confirmed the phase purity and compositional homogeneity of the source material. Transmission electron microscopy studies showed that CuIn3Te5 films are single-phase and polycrystalline in nature. Rutherford backscattering spectrometry studies revealed that the films are near stoichiometric. Optical transmittance analysis yielded a band gap of â¼1.03 ± 0.02 eV for CuIn3Te5 films, which is in close agreement with the value reported for bulk CuIn3Te5.
Keywords
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Materials Science
Electronic, Optical and Magnetic Materials
Authors
P. Malar, S. Savitha Pillai, S. Kasiviswanathan,