| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1527808 | Materials Chemistry and Physics | 2006 | 4 Pages |
Abstract
Using X-ray photoelectron spectroscopy (XPS) thermal oxidation of indium and gallium tellurides single crystals was studied. It was established, that oxidation produces layers of both metal and tellurium oxides on the surface, which drastically differs from indium and gallium sulphides and selenides own oxides. Possibility of formation of the other tellurium containing phases is discussed.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
O.A. Balitskii, W. Jaegermann,