Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1527912 | Materials Chemistry and Physics | 2006 | 4 Pages |
Abstract
Atomic force microscopy is employed to investigate the surface morphology of the {1 1 0} faces of MMTC crystals grown at 40 °C at a supersaturation of Ï = 0.5. Growth hillocks generated by dislocation sources often appear in groups, which leads to faster growth of the local area and forming layers with large height difference up to 30 nm. Growth centers operate nearly equally during the growth process. Serried and sparse monolayer steps dominate alternately on the surface, which is thought to be distinct phenomenon of the two-metal-centered complex compounds family.
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Authors
Y.L. Geng, D. Xu, X.Q. Wang, W. Du, H.Y. Liu, G.H. Zhang,