Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1528032 | Materials Chemistry and Physics | 2006 | 4 Pages |
Abstract
CdSe thin films were brush plated on conducting glass and titanium substrates maintained at temperatures in the range 5–30 °C from the precursors. The films exhibited hexagonal structure. Optical band gap was found to vary in the range of 1.65–2.1 eV as the substrate temperature is decreased from 30 °C. XPS measurements indicated the formation of CdSe. Atomic force microscopy studies indicated fine grains of the order of 10 nm for the films deposited at 5 °C. Luminescence measurement indicated emission at 520 nm for an excitation of 570 nm.
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Authors
K.R. Murali, P. Elango, P. Gopalakrishnan,