| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1528461 | Materials Science and Engineering: B | 2016 | 6 Pages |
•Properties of Co0.6Zn0.4Mn0.3Fe1.7O4 thin films on Pt-Si substrate are reported.•Reduction in thickness ∼27% with increased annealing temperature was found.•Partial (3 3 3) plane textured orientation was noted for these films.
This paper reports magnetic and magneto-optical properties of Co0.6Zn0.4Fe1.7Mn0.3O4 nanocrystalline thin films (thickness ∼140–200 nm) deposited on Pt (1 1 1)/Ti/SiO2/Si substrates by spin coating technique. Deposited films are then annealed at 600 °C and 700 °C for 60 min (significant reduction in film thickness from 200 nm to 140 nm was noted with the increase in post deposition annealing temperature). The X ray diffraction patterns confirmed the spinel cubic structure of Co0.6Zn0.4Fe1.7Mn0.3O4 films with polycrystalline phase and also indicated a partial <3 3 3> texture orientation. Deposited films showed magnetic anisotropy as evidenced from magnetic and magneto-optical measurements. Higher in plane remnant magnetization and low coercivity values as compared to out of plane ones were observed for both samples, indicating in plane alignment of easy axis of magnetization.
