Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1528650 | Materials Science and Engineering: B | 2014 | 5 Pages |
Abstract
- The TOF-SIMS analysis to investigate cathode diffusion during evaporation process.
- Performance change of OLEDs prepared with different evaporation rate of Al cathode.
- Change of electron transport behavior during thermal evaporation process.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Hee Young Shin, Min Chul Suh,