Article ID Journal Published Year Pages File Type
1528650 Materials Science and Engineering: B 2014 5 Pages PDF
Abstract

- The TOF-SIMS analysis to investigate cathode diffusion during evaporation process.
- Performance change of OLEDs prepared with different evaporation rate of Al cathode.
- Change of electron transport behavior during thermal evaporation process.
Related Topics
Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
Authors
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