Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1529735 | Materials Science and Engineering: B | 2010 | 9 Pages |
Abstract
This paper presents the results of an experimental study of large strain tensile and cyclic damage in nano-scale gold (Au) thin films that were electron-beam deposited onto a 1mm thick polymeric substrate of poly-di-methyl-siloxane (PDMS). The effects of Au film thickness are examined for films with thicknesses of 50, 75 and 100 nm. Large strain deformation (up to 100%) is shown to give rise to grain boundary cracking that results in significant changes in film resistance under monotonic and cyclic loading. The implications of the results are discussed for development of flexible electronic structures.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Onobu Akogwu, David Kwabi, Swaminadham Midturi, Marcus Eleruja, Babaniyi Babatope, W.O. Soboyejo,