| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1529793 | Materials Science and Engineering: B | 2011 | 8 Pages |
Abstract
The corrosion resistance of Ti–Si alloys has been studied in acid solutions and the alloys exhibit a high resistance to corrosion. SEM examinations combined with EDAX allowed to conclude that the passive films on Ti–Si alloys are mainly composed of TiO2/SiO2 oxides. XPS analysis indicated the formation of Si–O and Si–O–Ti bonds in the passive film, respectively corresponding to SiO2 and Si-doping TiO2. The effect of silicon on the corrosion was correlated to the formation of a stable SiO2 film, Si-doping on TiO2 and the extended lattice imperfections formed along TiO2/SiO2 grain boundaries and phase-boundaries. The calculated donor densities based on the point defect model were shown to depend exponentially on pH and linearly on potential.
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Authors
Zhonglin Jiang, Xin Dai, Hugh Middleton,