Article ID Journal Published Year Pages File Type
1530029 Materials Science and Engineering: B 2010 6 Pages PDF
Abstract

Al2O3-doped TiO2 thin films were prepared by combining electrophoretic deposition (EPD) with sputtering. A Corning* glass was used as a substrate, in which a titanium film was deposited by sputtering. Then, a precursor sol was prepared with Ti(n-OBu)4 and Al(s-OBu)3 and used as the medium for EPD. Next, the thin films were sintered and, finally, characterised by scanning electron microscopy (SEM), high resolution transmission electron microscopy (HRTEM) and X-ray diffraction (XRD). Several cultures of Escherichia coli, strain XL1-Blue, were prepared. Nine experiments were carried out. In three of them, an inoculum (a low amount of a product that contains bacteria) was prepared without a film; in the other six Al2O3-doped TiO2 film-coated glass substrates were irradiated with visible light before they were introduced in the inoculum. The SEM and EDS results showed that TiO2–Al2O3 films were obtained, covering all the glass substrate and with uniform size of particles forming them, and that the aluminium was distributed uniformly on the film. XRD results showed that rutile phase was obtained. By TEM, the structure of TiO2 was demonstrated. Al2O3-doped TiO2 thin films were successful at eliminating E. coli.

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Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
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