Article ID Journal Published Year Pages File Type
1530660 Materials Science and Engineering: B 2009 4 Pages PDF
Abstract

Solar cells made of heterojunctions between hydrogenated amorphous silicon (a-Si:H) thin films and crystalline silicon (c-Si) require good passivation of both front and back surface defects of the crystalline silicon wafers and low recombination at the interfaces. A good indicator of the interface quality is given by the effective lifetime that can be deduced from a modulated photoluminescence (MPL) technique by recording the frequency dependence of the photoluminescence phase shift with respect to the time-modulated light excitation. We apply the MPL technique to assess the passivation quality of different kinds of amorphous layers, for both p- and n-type silicon wafers as well as their evolution upon annealing. The MPL effective lifetimes are also compared to those deduced from the photoconductance technique.

Related Topics
Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
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