| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1531232 | Materials Science and Engineering: B | 2008 | 7 Pages |
Abstract
We present the results of a feasibility study of the capabilities of scanning white light interferometry (SWLI) to map large (macroscopic) areas of thin and ultrathin organic films deposited on mica and borosilicate glass substrates. We have shown that SWLI can provide useful characteristics (such as thickness and homogeneity) of polymer monolayers and surface patterns prepared by microcontact printing. We present the principle of operation of the technique and discuss the conditions under which SWLI can give reliable results, its strengths and its limitations.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Frédéric Madani-Grasset, Nhan T. Pham, Emmanouil Glynos, Vasileios Koutsos,