| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1531484 | Materials Science and Engineering: B | 2007 | 4 Pages |
Abstract
High quality SrBi2TaNbO9 (SBTN) ferroelectric thin films were fabricated on platinized silicon by pulsed laser deposition. Microstructure and ferroelectric properties of the films were characterized. Optical fatigue (light/bias) for the thin films was studied and the average remanent polarization dropped by nearly 55% due to the bias/illumination treatment. Optical properties of the thin films were studied by spectroscopic ellipsometry (SE) from the ultraviolet to the infrared region. Optical constants, n â¼Â 0.16 in the infrared region and n â¼Â 2.12 in the visible spectral region, were determined through refractive index functions. The band gap energy is estimated to be 3.93 eV.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Pingxiong Yang, Hongmei Deng, Meirong Shi, Ziyang Tong, Sumei Qin,