Article ID Journal Published Year Pages File Type
1531720 Materials Science and Engineering: B 2007 4 Pages PDF
Abstract
By using thermal electron emission data from the literature in addition to own measured results for totally 40 data sets of deep level centers in GaAs, we demonstrate that they can be divided into two different classes. We find that all the centers of this population, except one, can be interpreted as following the Meyer-Neldel rule. Under this condition, the magnitude of the matrix element determining their capture cross section is the most probable partitioning mechanism.
Related Topics
Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
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