| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1532057 | Materials Science and Engineering: B | 2006 | 4 Pages |
Abstract
Results of systematic studies on dielectric properties of Sr0.8Bi2.2(V0.2Nb0.8)2O9 prepared by solid state route is reported. A clear enhancement in the peak dielectric constant at the Curie temperature was noticed for Sr0.8Bi2.2(V0.2Nb0.8)2O9 compared to SrBi2Nb2O9. Scanning electron micrograph (SEM) of Sr0.8Bi2.2(V0.2Nb0.8)2O9 revealed dense structure by vanadium doping, although small voids or pores were found in the sample.
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Authors
B.J. Kalaiselvi, R. Sridarane, Ramaswamy Murugan,