| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1532178 | Materials Science and Engineering: B | 2006 | 4 Pages |
Abstract
Electronic and magnetic properties of bcc Co, Fe and Mn(0Â 0Â 1) epitaxial monolayers in contact with a single-crystalline MgO(0Â 0Â 1) film were studied using X-ray photoemission spectroscopy (XPS), X-ray absorption spectroscopy (XAS) and X-ray magnetic circular dichroism (XMCD) measurements. The XPS and XAS analysis clearly evidenced the weak hybridization between the MgO barrier and Fe or Co. On the contrary, a net oxidization of the Mn layer in contact with the MgO layer was observed. The magnetic properties were characterized by probing the XMCD signal of a unique atomic plane of transition metal in contact with MgO. The total magnetic moment per Co and Fe atoms were observed to increase compared to the bulk at the metal/oxide interface. Finally, Mn at the interface with MgO does not present any ferromagnetic behavior. This was assumed to be a consequence of the Mn oxidization.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
M. Sicot, Stéphane Andrieu, F. Bertran, F. Fortuna,