| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1533983 | Optics Communications | 2015 | 4 Pages |
Abstract
The paper reports a study of the thermal annealing effects on Mg0.2Zn0.8O ultraviolet photodetector with sequential annealing temperature (500, 600, 700 and 800 °C). As for the single hexagonal phase photodetector, the responsivity suddenly increases from 600 to 700 °C, which has been interpreted in terms of a qualitative model considering the thermal effects on the surface film. These results reveal a practicable route to improve the responsivity of Mg0.2Zn0.8O ultraviolet photodetector via the device thermal annealing.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Rusheng Liu, Dayong Jiang, Maiyu Zhou, Guang Yang, Long Sun, Chunguang Tian, Shang Gao, Qingcheng Liang, Jianxun Zhao, Jianhua Hou,