| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1534192 | Optics Communications | 2014 | 10 Pages |
Abstract
In this work, we investigate the influence of a pinhole on the resolution, the sectioning capability and the noise characteristics of a confocal fluorescence microscope combined with such an interferometer. Additionally, we demonstrate the benefits of image inversion interferometers for two-photon microscopes, as well as for extended-focus microscopes. As a result, the increase in information for interferometrically enhanced systems can be up to 500% in terms of the optical transfer function.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Daniel Weigel, Holger Babovsky, Armin Kiessling, Richard Kowarschik,