Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1535211 | Optics Communications | 2013 | 5 Pages |
Abstract
A very stable and robust schema for electronic speckle pattern interferometry configured to be sensible out-of-plane for studying phase objects is presented. It is based on a 4f imaging optical system, consisting of two windows in the object plane and a Ronchi ruling in the Fourier plane. One of the windows attends as a reference and the other acts as a probe arm. The speckle effect is created when a ground glass diffuser is placed in the object plane. Phase stepping is achieved out by Ronchi ruling translation, which is operated manually and validated with the Carré method. Analytic explanation and experimental results are shown.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Antonio Barcelata-Pinzon, Cruz Meneses-Fabian, Luar Moreno-Alvarez, Rosario Pastrana-Sanchez,