Atom microscopy using time-dependent physical spectrum

Time-dependent physical spectrum [J.H. Eberly, K. Wódkiewicz, J. Opt. Soc. Am., 67, 1252 (1977)] is revisited for atom microscopy. Two subsequent spontaneous emission measurements are incorporated for position measurement of single atom. In this scheme, three-level atomic system in Λ-typeΛ-type configuration undergoes dual atom–field interactions resulting in emission of two uncorrelated spontaneous photons. The detection of a pair of these photons leads to precision in position information of single atom. The scheme allows for an efficient atom microscopy with unique position information over a wide range of parameters.