| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1535453 | Optics Communications | 2013 | 5 Pages |
Abstract
We present a three-intensity ellipsometric technique to obtain analytical solutions for the surface inclination and ellipsometric parameters under surface plasmon resonance (SPR) condition. The relation between the phase change of ellipsometric parameter and tilt angle of the test surface was obtained after a careful calibration procedure. Four-channel SPR images with different refractive indexes liquids and immobilized biomolecules were demonstrated. Also, the alignment of surface normal and the collimation of the incident light beam were examined in the measurement.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Chien-Yuan Han, Chien-Wei Luo,