Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1535829 | Optics Communications | 2012 | 4 Pages |
Abstract
In interferogram or fringe pattern analysis, a technique capable of automatically analyzing interferograms that contain complex fringes and high-level noise as well as defects is highly demanded. In this paper, a hybrid technique combining the concepts of the two-dimensional continuous wavelet transform technique and the phase-shifting technique is proposed. The novel technique takes the advantages of the two existing techniques, and has the ability to accurately and automatically analyze multiple phase-shifted complex interferograms involving noise and defects. The validity of the technique is demonstrated by both computer simulation and real experiment.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Jun Ma, Zhaoyang Wang, Minh Vo,