Article ID Journal Published Year Pages File Type
1535829 Optics Communications 2012 4 Pages PDF
Abstract

In interferogram or fringe pattern analysis, a technique capable of automatically analyzing interferograms that contain complex fringes and high-level noise as well as defects is highly demanded. In this paper, a hybrid technique combining the concepts of the two-dimensional continuous wavelet transform technique and the phase-shifting technique is proposed. The novel technique takes the advantages of the two existing techniques, and has the ability to accurately and automatically analyze multiple phase-shifted complex interferograms involving noise and defects. The validity of the technique is demonstrated by both computer simulation and real experiment.

Related Topics
Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
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