Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1535931 | Optics Communications | 2012 | 4 Pages |
Abstract
A technique for fringe analysis using variance of directly fringe-shifted shearograms is demonstrated experimentally. Statistical variations in each of the fringe-shifted shearograms are calculated to obtain a contrast map which is then used to characterize sub-surface defects and mechanical loading points. The technique offers reduced computational load compared to Fourier transform-based fringe processing algorithms. The technique is implemented using both phase difference maps and interferograms. The latter allows the extension of the technique to physical (i.e., non-reconstructed) interferograms for the analysis of dynamic systems.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Francesca Celine I. Catalan, Anne Margarette S. Maallo, Percival F. Almoro,