Article ID Journal Published Year Pages File Type
1535931 Optics Communications 2012 4 Pages PDF
Abstract

A technique for fringe analysis using variance of directly fringe-shifted shearograms is demonstrated experimentally. Statistical variations in each of the fringe-shifted shearograms are calculated to obtain a contrast map which is then used to characterize sub-surface defects and mechanical loading points. The technique offers reduced computational load compared to Fourier transform-based fringe processing algorithms. The technique is implemented using both phase difference maps and interferograms. The latter allows the extension of the technique to physical (i.e., non-reconstructed) interferograms for the analysis of dynamic systems.

Related Topics
Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
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