Article ID Journal Published Year Pages File Type
1535940 Optics Communications 2012 5 Pages PDF
Abstract

A three-dimensional on-line measurement method based on five unequal steps phase-shifting with phase measuring profilometry is presented. While only one sinusoidal grating pattern is projected onto the measured object moving with the pipe-line, five arbitrary deformed patterns are captured by CCD as the measured object moves within a duty cycle of the grating pattern. The modulation distribution based on Fourier transform profilometry is introduced to realize pixel matching so as to calculate the corresponding equivalent shifted phase on the deformed patterns. A five unequal steps phase shifting algorithm is developed, which is suitable for non-uniform motion of the pipeline. The experiments verify its feasibility and validity.

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Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
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