Article ID Journal Published Year Pages File Type
1536080 Optics Communications 2012 7 Pages PDF
Abstract
To achieve high lateral resolution overcoming the diffraction limit, a two-color phase plate (TPP) for generating a quasi-Laguerre-Gaussian beam was applied to super-resolution microscopy (SRM) based on fluorescence depletion. Putting the TPP into a robust optical path in a commercial laser-scanning microscope, we obtained a point spread function with a full width at half maximum three times smaller than diffraction limit. The measured contrast transfer function shows that line and space patterns finer than the diffraction limit were clearly resolved and the image contrast was improved. Since the TPP can easily improve lateral resolution in SRM without any precise adjustment, our setup provides a practical super-resolution microscope.
Related Topics
Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
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