| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1536105 | Optics Communications | 2012 | 4 Pages |
Abstract
Laser beam deflectometry was used to follow the growth dynamic of C60 nanorods via an interfacial diffusion and self-assembly phenomenon. The deduced average value of the interfacial diffusion coefficient Dint from the refractive index gradient was found to be of the order of 3.32 10− 6 m2/s.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Ch. Mtshali, D. Hamidi, T. Kerdja, P. Buah Bassuah, H. Haneda, M. Maaza,