| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1537154 | Optics Communications | 2011 | 4 Pages |
Abstract
A reversal 4f coherent imaging system with phase objects is presented to measure nonlinear refraction of the materials. The modified system can increase the sensitivity compared with the conventional nonlinear-imaging technique with phase objects. The sensitivity enhancement of the modified system is about two times greater than the conventional technique within 0 ≤ ΔφNL ≤ 1. CS2 is used to demonstrate the measurement using the reversal 4f coherent imaging system with phase objects.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Junyi Yang, Yinglin Song, Xueru Zhang, Yuxiao Wang, Changwei Li, Min Shui, Xiao Jin,