| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1538288 | Optics Communications | 2008 | 4 Pages |
Abstract
Laser beam quality evaluation is generally carried out through the measurement of the M2 second-moment. This standard procedure is time consuming and is difficult to be implemented for checking, for instance, each VCSEL diode moving out of the assembly line of a high volume production factory. In this paper, we propose an alternative fast method allowing to distinguish easily a single transverse mode from a multiple transverse mode behaviour. This method is based on an electronic analysis (locking amplifier) of the local slope of the output laser characteristic, i.e. laser output power versus pumping.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Renaud de Saint Denis, Michael Fromager, Kamel Ait-Ameur,