| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1538344 | Optics Communications | 2010 | 8 Pages |
Abstract
The optical properties of graded chiral sculptured TiO2 thin films in axial and non-axial excited states are calculated using the rigorous coupled wave analysis method (RCWA) in conjunction with the Bruggeman homogenization formalism. The filtering frequency and polarization selectivity of these graded nanostructured TiO2 sculptured thin films showed dependence on both structural and deposition parameters. The results achieved are consistent with the experimental data [K. M. Krause and M. J. Bret, Adv. Funct. Mater. 18 (2008) 3111].
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
F. Babaei, A. Esfandiar, H. Savaloni,