Article ID Journal Published Year Pages File Type
1538473 Optics Communications 2010 4 Pages PDF
Abstract

The third-order optical nonlinear refractive properties of InAs/GaAs quantum dots grown by molecular beam epitaxy have been measured using the reflection Z-scan technique at above-bandgap energy. The nonlinear refractive index and nonlinear absorption index of the InAs/GaAs quantum dots were determined for wavelengths from 740 to 777 nm. The measured results are compared with the nonlinear refractive response of several typical III–V group semiconductor materials. The corresponding mechanisms responsible for the large nonlinear response are discussed.

Related Topics
Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
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