Article ID Journal Published Year Pages File Type
1538941 Optics Communications 2007 9 Pages PDF
Abstract
The transfer functions of the analyser-based imaging system are expressed and discussed in terms of the analyser point-spread function and of an offset function which takes into account the partial coherence characteristics of the X-ray beam, particularly its wavelength spread. A description of the imaging process in terms of ambiguity functions is presented and is used to discuss the validity conditions of the transfer functions.
Related Topics
Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
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