Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1538941 | Optics Communications | 2007 | 9 Pages |
Abstract
The transfer functions of the analyser-based imaging system are expressed and discussed in terms of the analyser point-spread function and of an offset function which takes into account the partial coherence characteristics of the X-ray beam, particularly its wavelength spread. A description of the imaging process in terms of ambiguity functions is presented and is used to discuss the validity conditions of the transfer functions.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
J.P. Guigay, E. Pagot, P. Cloetens,