| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1539388 | Optics Communications | 2010 | 5 Pages |
Abstract
We present an etalon-based method of calibrating the frequency of terahertz time-domain spectrometers (THz TDS). The method utilizes the etalon effect produced by multiple reflections in non-absorbing wafers or in narrow air–gaps. The technique provides frequency calibration across the measurement band with uncertainties comparable with the typical THz TDS resolution.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
M. Naftaly, R.A. Dudley, J.R. Fletcher,