Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1539541 | Optics Communications | 2009 | 4 Pages |
Abstract
In this work, the backaction of a detector on light reflected from a dielectric medium is theoretically studied in the far-field region by considering every order of light scattering both within the medium and between the detector and the medium. It is found that, as a result of the backaction, the light actually measured by the detector is different from that when the detector is absent, and that the strength of the backaction depends on several factors, such as the separation between the detector and the medium, the medium's density, and the light wavelength. Also presented is a method that allows the reflected light in the absence of the detector to be derived from the reflected light measured by the detector.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Wei Guo, Yildirim Aktas,