Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1539697 | Optics Communications | 2008 | 4 Pages |
Abstract
The nonlinear absorption and nonlinear refractive index of hydrogenated amorphous silicon-selenium (a-Si,Se:H) film prepared by a plasma-enhanced chemical deposition process was measured using a z-scan technique. Intensity dependent transmission was observed and attributed to reverse saturation absorption (optical limiting). The thermal contribution to nonlinear refractive index is discussed. The nonlinear response time was measured by using the pump and probe technique. Reverse saturating absorption was utilized to demonstrate all optical switching.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Fryad Z. Henari,