Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1539747 | Optics Communications | 2008 | 8 Pages |
We demonstrate an optical technique to derive the two-dimensional energy conversion efficiency (ηCE), fill factor (FF) and external quantum efficiency (ηQE) distributions across the surface of photovoltaic devices. A compact, inexpensive optical-feedback laser diode microscope is constructed to acquire the confocal reflectance and efficiency maps enabling the observation of the local parametric behavior in silicon photodiodes in photovoltaic mode and single-junction solar cells. The ηCE and ηQE distributions are greatly influenced by local parasitic resistances that depend on laser irradiance. These parasitic resistances decrease the ηCE and ηQE values with distance from the contact electrode at high laser irradiance. The optical technique enables microscopic comparison of ηCE and ηQE within the pn-overlay region of the photodiode sample, revealing its optimization for photodetection rather than power generation. The technique also elucidates the decreasing local ηCE of the solar cell under intense irradiation.