| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1539881 | Optics Communications | 2006 | 5 Pages |
Abstract
Mesoporous layers of silica deposited onto Si + SiO2 are of interest for many optical applications. Reflectance spectra measured at normal incidence of such composite structure show a behaviour that has been attributed mainly to interference created by the interfaces, and, therefore, only weakly influenced by coherent scattering inside of the mesoporous layer.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
P. Cheyssac,