| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1540220 | Optics Communications | 2007 | 6 Pages |
Abstract
A new technique is proposed for generating a tight dark focal spot surrounded by uniform light intensity in all directions. It is based on a single focusing lens illuminated from one side, hence the alignment sensitivities associated with 4π methods are eliminated. Such a beam can be useful, e.g. as a dark atomic trap, and as the erase beam in three dimensional super-resolution fluorescence microscopy.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Nándor Bokor, Nir Davidson,