| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1540448 | Optics Communications | 2007 | 4 Pages |
Abstract
Electric field modeling of nodular defects is performed to investigate the interaction between defective multilayer coatings and Gaussian profile laser beam. Light-intensity is significantly enhanced as large as six times in areas adjacent to the defect boundary as well as within the defects. Different geometry of defects irradiated by a range of 0–45° incident laser is analyzed. Nodules with large but shallow seed or in the case of 45° oblique incidence tend to have the greatest enhancement effect.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Ying Wang, Yueguang Zhang, Xu Liu, Weilan Chen, Peifu Gu,