All-optical super resolved and extended depth of focus imaging with random pinhole array aperture

In this paper, we present a novel approach which allows combining super resolved imaging with extended depth of focus while the result is obtained by all-optical means and no digital processing is required. The presented approach for the super resolved imaging includes attaching a random pinhole array plate to the aperture plane of the imaging system. The energetic efficiency of the system is high and it is much larger than an imaging through a single pinhole which also has extended depth of focus. The super resolving result is obtained by mechanic scanning of the aperture plane with the random plate.