Article ID Journal Published Year Pages File Type
1540847 Optics Communications 2008 6 Pages PDF
Abstract

We present the simultaneous measurement of the two in-plane displacement components by electronic speckle pattern interferometry with three object beams and without an in-line reference beam. Three interference fringe patterns, corresponding to three different sensitivity vectors, are recorded in a single interferogram and separated by means of the Fourier transform method. Then, two interference fringe patterns are selected to obtain the in-plane displacement components.

Keywords
Related Topics
Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
Preview
Simultaneous measurement with one-capture of the two in-plane components of displacement by electronic speckle pattern interferometry
Authors
, , , ,