Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1540901 | Optics Communications | 2008 | 6 Pages |
Abstract
Zernike aberrations, estimated with respect to the wavefront sensor's reference frame by least-squares, are currently transformed to other frames using algebraic relationships. Obviously, they can also be estimated directly with respect to the transformed frames. In this paper, we demonstrate the equivalence between these two approaches in terms of bias and noise propagation, when the reference frames are related by a linear conformal transformation of coordinates.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
J. Arines, P. Prado, S. Bará, E. Acosta,