| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1540967 | Optics Communications | 2008 | 6 Pages |
Abstract
An analytical method is proposed for calculating reflection-spectrum envelope of interleaved sampled gratings with phase-shifts. Effects of parameters on reflection-spectrum envelope of the grating are discussed, such as two grating segment lengths, phase-shift and interleaved length. The unique optimal interleaved length can be obtained to provide the broadest flat-top reflection-spectrum envelope without ripples. Accuracy of the analytical expression is verified due to the calculated results in good agreement with the reflection spectra obtained by the piecewise uniform transform matrix method.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Xiaoying He, Yonglin Yu, Dexiu Huang, Ruikang Zhang, Wen Liu, Shan Jiang,