Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1541044 | Optics Communications | 2008 | 5 Pages |
Abstract
A one-shot method for measuring birefringence dispersion has been proposed that utilizes two retarders having different high-order birefringences. The intensity distribution of a channeled spectrum changes with different frequencies as a function of wavenumber. An intensity distribution is sufficient to determine the birefringence dispersion using the amplitude and phase components obtained by applying the fast Fourier transform. Experimental results demonstrate that this technique can measure the wavelength dependences of both the azimuthal angle and the retardation.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Toshitaka Wakayama, Yukitoshi Otani, Norihiro Umeda,