Self-consistent model for ultrafast near-field microscopy and near-field luminescence microscopy modeling of semiconductor surface

The method of calculation of near-field images and near-field luminescence images of semiconductor surface with exciton cloud and nanostructure is proposed. The method is based on Green function technique in the frame of concept of local-filed. The main characteristic of the proposed approach is maximal usage analytical calculations. The evolution of near-filed images and near-field luminescence images of (the system) the exciton cloud near the nanostructure are analyzed. Developed approach is universal and could be able to description of experimental data on time-resolved near-field microscopy and time-resolved near-field luminescence.