Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1541178 | Optics Communications | 2008 | 9 Pages |
Abstract
In this report we show that the amplitude of specularly diffracted light from a plane rough surface as a function of incident angle cosine is Fourier transform of the height distribution on the surface. Therefore, an even height distribution function, which is the case for many rough surfaces, can be obtained by measuring the specularly diffracted light intensities. Also, it is observed that for polychromatic illumination the spectrum of the specularly diffracted light is modified and the modification depends on roughness, incident angle, and wavelength. It is also shown that, for a fixed incident angle, the height distribution on the rough plane is Fourier transform of the spectral modifying function. Experimental studies on some surfaces of different roughnesses, prepared by grinding sheet-glasses by powders of different grain sizes, show that the corresponding height distributions are Gaussian and the rms heights obtained by the two approaches are quite consistent.
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Electronic, Optical and Magnetic Materials
Authors
M.T. Tavassoly, M. Dashtdar,