| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1541484 | Optics Communications | 2008 | 7 Pages |
Abstract
We describe a self-referencing method of wavefront sensing based on rotated lateral shearing interferometry which is able to measure the local slope of a wavefront. We describe the principle of operation, suggest a number of practical implementations, and present experimental results. We found the difference between two sequential measurements of a nominally flat wavefront to be better than λ/250 root mean square.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
M. Schwertner, M.J. Booth, T. Wilson,