Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1541604 | Optics Communications | 2007 | 5 Pages |
Abstract
A method bases on beam propagation method and image processing is brought forward to reconstruct the extraordinary refractive index profile of the ion-implanted single-mode channel waveguide in lithium niobate. Channel waveguide is formed by O2+ ion implantation at three energies of (3.0, 3.6 and 4.5Â MeV) and respective doses of (1.8, 2.2 and 4.8)Â ÃÂ 1014Â ions/cm2 in vacuum at room temperature. Only one enhanced-index mode is observed for extraordinary light at 1539Â nm by prism-coupling method. TRIM'98 code is used to simulate the damage profile in channel waveguide. The modes pattern of TE and TM are measured by use of end-face coupling method.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Xiangzhi Liu, Fei Lu, Feng Chen, Ruifeng Zhang, Hanping Liu, Lei Wang, Gang Fu, Haisong Wang,