| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1541757 | Optics Communications | 2006 | 4 Pages |
Abstract
Modification of the Schwarzschild optics for applications in hard X-ray imaging is discussed. The conditions necessary to achieve a high spatial resolution with two toroidally bent crystals in the Bragg geometry are formulated, and the focusing properties of the system are numerically simulated using the ray tracing method. It is predicted that such a system could provide a spatial resolution considerably higher than the resolution of the presently available X-ray optics.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
S.G. Podorov, A. Nazarkin, E. Förster,