Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1542072 | Optics Communications | 2006 | 6 Pages |
Abstract
We analyze spectral phase extraction from a measured structured spectral shearing interference with both conventional Fourier-transform and wavelet-transform algorithms. Analysis from measured spectral interference shows that the filter used in Fourier technique results in uncertainties in extracted spectral phase; however, the parameters of wavelet-transform unlikely introduce errors in the extracted spectral phase.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Yuqiang Deng, Zubin Wu, Shiying Cao, Lu Chai, Ching-yue Wang, Zhigang Zhang,